As a result, this form of valuable physical evidence has been the subject of admissibility challenges. In this study, we apply statistical techniques used in facial pattern recognition to a minimal set of information gleaned from accidental patterns. That is, in order to maximize the amount of potential similarity between patterns, we only use the coordinate locations of accidental marks (on the top portion of a footwear impression) to characterize the entire pattern. This allows us to numerically gauge how similar two patterns are to one another in a worst-case scenario, i.e., in the absence of a tremendous amount of information normally available to the footwear examiner, such as accidental mark size and shape. The patterns were recorded from the top portion of the shoe soles (i.e., not the heel) of five shoe pairs. All shoes were the same make and model and all were worn by the same person for a period of 30 days. We found that in 20-30 dimensional principal component (PC) space (99.5 percent variance retained), patterns from the same shoe, even at different points in time, tended to cluster closer to each other than patterns from different shoes. Correct shoe identification rates using maximum likelihood linear classification analysis and the hold-one-out procedure ranged from 81 percent to 100 percent. Although low in variance, three-dimensional PC plots were made and generally corroborated the findings in the much higher dimensional PC-space. This study is intended to be a starting point for future research to build statistical models on the formation and evolution of accidental patterns. 5 figures, 3 tables, and 33 references (Published abstract)