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NCJ Number: 183295 Find in a Library
Title: Applications of Focused Ion Beam Systems in Gunshot Residue Investigation
Journal: Journal of Forensic Sciences  Volume:44  Issue:1  Dated:January 1999  Pages:105-109
Author(s): Ludwig Niewohner Ph.D.; H. Walter Wenz Ph.D.
Date Published: January 1999
Page Count: 5
Type: Research (Applied/Empirical)
Format: Article
Language: English
Country: United States of America
Annotation: This research focused on the use of ion beam (FIB) systems for the analysis of gunshot residues (GSR) and concluded that the four types of 9 millimeter parabellum ammunition tested produced GSR particles with individual and unique interior morphologies.
Abstract: FIB allows the examiner to cut a preselected GSR particle to make it possible to view the core and determine interior morphology and character to use to identify the ammunition manufacturer. The researchers obtained the sample particles for each of the four ammunition types by exposing four separate, typical, collection stubs to the down-range environment of the 9 millimeter pistol. Scanning electron microscopy/EX analyzed representative particles elementally. Their locations were recorded for future examination by FIB. Some particles of all brands were solid on the inside; therefore, the interior morphology was not present in all the particles samples. However, the descriptions applied consistently and without exception to the particles from a particular manufacturer when morphology was present. Photographs and 7 references (Author abstract modified)
Main Term(s): Science and Technology
Index Term(s): Ammunition; Firearms identification; Gunshot residue; Scientific techniques; Trace evidence
To cite this abstract, use the following link:
http://www.ncjrs.gov/App/publications/abstract.aspx?ID=183295

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